Accurate Projector-Camera-Calibration from Structured Light Dot Patterns via Subpixel Plane Reconstruction

An accurate projector-camera calibration method using structured light dot patterns with subpixel plane reconstruction for high-precision 3D measurement.

Accurate Projector-Camera-Calibration from Structured Light Dot Patterns via Subpixel Plane Reconstruction

We present a method for accurate projector-camera calibration using structured light dot patterns and subpixel plane reconstruction. The approach extracts dense, subpixel-accurate plane observations from dot-pattern captures and uses them to refine the geometric calibration between projector and camera, resulting in improved 3D reconstruction accuracy for structured-light systems.

Citation (BibTeX)

@inproceedings{reese2025accurate,
  author    = {David Reese and Evgeny Degtyarev and Rico Nestler},
  title     = {Accurate Projector-Camera-Calibration from Structured Light Dot Patterns via Subpixel Plane Reconstruction},
  booktitle = {Anwendungsbezogener Workshop "3D in Science & Applications" (3D-iSA), Tagungsband},
  publisher = {GFaI e. V., Berlin},
  pages     = {XX--XX},
  year      = {2025},
  month     = nov,
  isbn      = {978-3-942709-XX-X},
  note      = {Presented at 3D-iSA, Nov. 2025}
}